Fault Diagnosis of Analog Integrated Circuits by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha
English | PDF | 2005 | 183 Pages | ISBN : 038725742X | 6.3 MB
System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort.